Electro-optic dual-comb interferometry over 40-nm bandwidth
Artikel i vetenskaplig tidskrift, 2016

Dual-comb interferometry is a measurement technique that uses two laser frequency combs to retrieve complex spectra in a line-by-line basis. This technique can be implemented with electro-optic frequency combs, offering intrinsic mutual coherence, high acquisition speed and flexible repetition-rate operation. A challenge with the operation of this kind of frequency comb in dual-comb interferometry is its limited optical bandwidth. Here, we use coherent spectral broadening and demonstrate electro-optic dual-comb interferometry over the entire telecommunications C band (200 lines covering ~ 40 nm, measured within 10 microseconds at 100 signal-to-noise ratio per spectral line). These results offer new prospects for electro-optic dual-comb interferometry as a suitable technology for high-speed broadband metrology, for example in optical coherence tomography or coherent Raman microscopy.

Författare

Vicente Andrés Durán Bosch

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Peter Andrekson

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Victor Torres Company

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Optics Letters

0146-9592 (ISSN) 1539-4794 (eISSN)

Vol. 41 4190-4193

Styrkeområden

Informations- och kommunikationsteknik

Livsvetenskaper och teknik

Ämneskategorier

Telekommunikation

Atom- och molekylfysik och optik

DOI

10.1364/OL.41.004190

PubMed

27628354