A procedure for the extraction of a nonlinear microwave GaN FET model
Artikel i vetenskaplig tidskrift, 2017

In this paper, we describe an extraction procedure of nonlinear models for microwave field-effect transistor (FET). We use a nonlinear model available in commercial CAD tools, and we extract the parameters by combining direct extraction and numerical optimization. We determine a first estimate of the model parameters by few DC and S-parameter measurements. Next, we refine the parameters by optimization against low-frequency and high-frequency vector-calibrated large-signal measurements gathered with a Large-Signal-Network Analyzer (LSNA). As case study we consider a 0.25x200 mu m(2) GaN FET on SiC for power amplifier applications. Ultimately, we want to show that a good accuracy level can be achieved while minimizing the extraction effort and that an accurate model can be built and suitably tailored depending on the final application.

vector-calibrated measurements

nonlinear model extraction

FET nonlinear model

large-signal network analyzer

Författare

G. Avolio

KU Leuven

V. Vadala

University of Ferrara

Iltcho Angelov

Chalmers, Mikroteknologi och nanovetenskap (MC2), Mikrovågselektronik

A. Raffo

University of Ferrara

M. Marchetti

Maury Microwave Company

G. Vannini

University of Ferrara

D. Schreurs

KU Leuven

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

0894-3370 (ISSN) 1099-1204 (eISSN)

Vol. 30 1 UNSP e2151-

Ämneskategorier

Elektroteknik och elektronik

DOI

10.1002/jnm.2151

Mer information

Senast uppdaterat

2018-05-29