A new method of determining the effective channel width and its dependence on the gate voltage
Paper i proceeding, 1996

A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance.

Data mining

Fluctuations

Performance evaluation

Geometry

Electrical resistance measurement

Voltage

Particle measurements

Robustness

Solid state circuits

Integrated circuit measurements

Författare

Peter R. Karlsson

Institutionen för fasta tillståndets elektronik

Kjell Jeppson

Institutionen för mikroelektronik och nanovetenskap

Institutionen för fasta tillståndets elektronik

Anders Bogren

Institutionen för fasta tillståndets elektronik

Proceedings of the IEEE International Conference on Microelectronic Test Structures ICMTS

Vol. 1996

Ämneskategorier

Elektroteknik och elektronik

ISBN

0-7803-2783-7