Thermal noise-limited sensitivity of FET-based terahertz detectors
Paper i proceeding, 2017

Here we present a detailed study on estimation of noise-dependent parameters, such as signal-to-noise ratio (SNR) or noise equivalent power (NEP), of field-effect-transistor based terahertz detectors (TeraFETs). Commonly, these parameters are estimated from a well-known assumption, that detector's performance is limited by the thermal noise of transistor's channel. However, practice shows that the influence of other noise sources or transient effects is considerable. We summarize TeraFET noise measurements performed on different material systems based transistors, such as AlGaN/GaN, AlGaAs/GaAs, silicon CMOS, and monolayer graphene. We have achieved a good agreement between thermal noise and measured data. However, attention has to be paid to gate leakage currents and slow defect charging and discharging effects, which can strongly influence TeraFET's performance estimation.

Författare

D. Cibiraite

Unknown organization

M Bauer

Unknown organization

A. Lisauskas

Unknown organization

V. Krozer

Unknown organization

H. G. Roskos

Unknown organization

A. Rämer

Unknown organization

W. Heinrich

Unknown organization

S. Pralgauskaite

Unknown organization

J. Zdanevicius

Unknown organization

J. Matukas

Unknown organization

MICHAEL ANDERSSON

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

Jan Stake

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

2017 International Conference on Noise and Fluctuations, ICNF 2017, Vilnius, Lithuania, 20-23 June 2017

7986008

International Conference on Noise and Fluctuations (ICNF)
Vilnius, Lithuania,

Styrkeområden

Informations- och kommunikationsteknik

Nanovetenskap och nanoteknik

Infrastruktur

Nanotekniklaboratoriet

Ämneskategorier

Annan elektroteknik och elektronik

DOI

10.1109/ICNF.2017.7986008