Individual grain orientations and texture development of nanocrystalline electrodeposits showing abnormal grain growth
Artikel i vetenskaplig tidskrift, 2007
The electron backscatter diffraction (EBSD) technique has been used to determine grain orientations of abnormally growngrains in nanocrystalline
Ni electrodeposits upon annealing. The results show that the first grown grains have a <3 1 1>//ND orientation. Upon annealing further grain growth
occurs and the preferred alignment of the abnormally growing grains changes from <3 1 1>//ND to <1 1 1>//ND. The subgrain coalescence model
adopted from recrystallization is used to describe the occurrence of abnormal grain growth, and energy considerations are put forward for explaining
the dominance of the <1 1 1>//ND texture component after longer annealing treatments.
Scanning and transmission electron microscopy