Individual grain orientations and texture development of nanocrystalline electrodeposits showing abnormal grain growth
Artikel i vetenskaplig tidskrift, 2007

The electron backscatter diffraction (EBSD) technique has been used to determine grain orientations of abnormally growngrains in nanocrystalline Ni electrodeposits upon annealing. The results show that the first grown grains have a <3 1 1>//ND orientation. Upon annealing further grain growth occurs and the preferred alignment of the abnormally growing grains changes from <3 1 1>//ND to <1 1 1>//ND. The subgrain coalescence model adopted from recrystallization is used to describe the occurrence of abnormal grain growth, and energy considerations are put forward for explaining the dominance of the <1 1 1>//ND texture component after longer annealing treatments.


X-ray diffraction

Scanning and transmission electron microscopy

Crystal growth



Uta Klement

Chalmers, Material- och tillverkningsteknik, Yt- och mikrostrukturteknik

Melina da Silva

Chalmers, Material- och tillverkningsteknik, Yt- och mikrostrukturteknik

Jounal of Alloys and Compounds

Vol. 434-435 714-717



Mer information