Optical microprism cavities based on dislocation-free GaN
Artikel i vetenskaplig tidskrift, 2020

Three-dimensional growth of nanostructures can be used to reduce the threading dislocation density that degrades III-nitride laser performance. Here, nanowire-based hexagonal GaN microprisms with flat top and bottom c-facets are embedded between two dielectric distributed Bragg reflectors to create dislocation-free vertical optical cavities. The cavities are electron beam pumped, and the quality (Q) factor is deduced from the cavity-filtered yellow luminescence. The Q factor is similar to 500 for a 1000nm wide prism cavity and only similar to 60 for a 600nm wide cavity, showing the strong decrease in Q factor when diffraction losses become dominant. Measured Q factors are in good agreement with those obtained from quasi-3D finite element frequency-domain method and 3D beam propagation method simulations. Simulations further predict that a prism cavity with a 1000nm width will have a Q factor of around 2000 in the blue spectral regime, which would be the target regime for real devices. These results demonstrate the potential of GaN prisms as a scalable platform for realizing small footprint lasers with low threshold currents.

Författare

Filip Hjort

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Maryam Khalilian

Lunds universitet

Jörgen Bengtsson

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Marcus Bengths

Student vid Chalmers

Johan Gustavsson

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Anders Gustafsson

Lunds universitet

Lars Samuelson

Lunds universitet

Åsa Haglund

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Applied Physics Letters

0003-6951 (ISSN) 1077-3118 (eISSN)

Vol. 117 23 231107

Ämneskategorier

Acceleratorfysik och instrumentering

Atom- och molekylfysik och optik

Annan fysik

DOI

10.1063/5.0032967

Mer information

Senast uppdaterat

2021-01-07