Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X Rays
Artikel i vetenskaplig tidskrift, 2021

Dynamical diffraction effects in thin single crystals produce highly monochromatic parallel x-ray beams with a mutual separation of a few microns and a time delay of a few femtoseconds—the so-called echoes. This ultrafast diffraction effect is used at X-Ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent x-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step toward the ambitious goal of strain tailoring new x-ray optics and, conversely, open up the possibility of using ultrafast dynamical diffraction effects to study strain in materials.

Författare

Angel Rodriguez-Fernandez

European XFEL

Ana Diaz

Paul Scherrer Institut

Anand Harihara Subramonia Iyer

Chalmers, Fysik, Mikrostrukturfysik

Mariana Verezhak

Paul Scherrer Institut

Klaus Wakonig

Paul Scherrer Institut

Magnus Hörnqvist Colliander

Chalmers, Fysik, Mikrostrukturfysik

Dina Carbone

Lunds universitet

Physical Review Letters

0031-9007 (ISSN) 1079-7114 (eISSN)

Vol. 127 15 157402

Ämneskategorier

Acceleratorfysik och instrumentering

Atom- och molekylfysik och optik

Materialkemi

DOI

10.1103/PhysRevLett.127.157402

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Senast uppdaterat

2021-10-27