Evaluation of Graphene-Enhanced Thermal Interface Material in Air and Immersion Cooling Systems
Paper i proceeding, 2025

This study presents a detailed performance evaluation of a graphene-enhanced thermal interface material (TIM) conducted at RISE ICE Data Center. Tests were performed on Open Compute Project (OCP) Leopard servers using three different TIMs: conventional thermal paste, graphene-enhanced thermal pad GT90 from SHT Smart High Tech AB (SHT), and indium foil. Three sets of experiments were conducted: (1) air cooling with default chassis fan control in a bespoke server wind tunnel, (2) air cooling with controlled, fixed fan speeds and different heatsink mounting pressures operating in the wind tunnel and (3) immersion cooling tests with two coolant flow rates at fixed inlet temperatures. Results indicate that graphene-enhanced TIM and thermal paste exhibit similar performance in experiment (1), whereas indium foil TIM tests showed the undesired effect of increased CPU temperatures. In experiment (2), servers equipped with graphene-enhanced TIM showed lower CPU temperatures in comparison to the servers equipped with Indium foil TIM. In experiment (3), immersion cooling resulted in lower CPU temperatures overall, with the graphene-enhanced TIM again providing lower temperatures than indium foil at a similar mounting pressure. The findings suggest that the interfacial thermal conductivity and material compatibility of the GT90 TIM contribute to an improved performance in the tested immersion cooling system as well as the importance of mounting pressure.

Graphene

Thermal Interface Material

Indium

Data Center Thermal Management

Immersion Cooling

Air Cooling

Författare

Henrik Barestrand

RISE Research Institutes of Sweden

Markus Enmark

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Jonas Gustafsson

RISE Research Institutes of Sweden

Tina Stark

RISE Research Institutes of Sweden

Hakan Fredriksson

RISE Research Institutes of Sweden

Johan Liu

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Jon Summers

RISE Research Institutes of Sweden

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

10652221 (ISSN)

106-112
9781735532554 (ISBN)

41st Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2025
San Jose, USA,

Ämneskategorier (SSIF 2025)

Annan elektroteknik och elektronik

Mer information

Senast uppdaterat

2025-05-22