Development of a Setup for High-Field Dielectric Frequency Response Characterization
Artikel i vetenskaplig tidskrift, 2026

Modern power system capacitors operate under extreme electrical stresses, necessitating advanced diagnostic techniques to assess their performance. While commercial instruments for measurements of dielectric frequency response (DFR) provide valuable insights into materials performance, they can be limited in their voltage range, restricting their applicability to high-field conditions. This paper presents the development of a high-voltage DFR measurement system designed for high-field dielectric characterization of polymeric materials. The proposed system overcomes the limitations of existing instruments by extending the measurable electric field range, enabling the study of nonlinear dielectric effects. The system's performance is validated through comparative measurements of a vacuum capacitor, a low-loss ceramic capacitor, and a polyethylene terephthalate (PET) film sample with gold-deposited electrodes. Results demonstrate the system’s ability to measure dielectric loss factors down to the 10⁻⁵ range, exceeding the resolution of the commercial instrument used for comparison in this study. Furthermore, field-dependent variations in dielectric properties are successfully captured, highlighting the system's capability for studying nonlinear dielectric behavior under high electric fields. The developed methodology contributes to the optimization of dielectric materials for next-generation power system capacitors.

polymeric dielectrics.

high-voltage dielectric characterization

complex capacitance

dielectric loss factor

Dielectric frequency response

Författare

Daniel Svensson

Chalmers, Elektroteknik, Elkraftteknik

Thomas Hammarström

Chalmers, Elektroteknik, Elkraftteknik

Xiangdong Xu

Chalmers, Elektroteknik, Elkraftteknik

Yuriy Serdyuk

Chalmers, Elektroteknik, Elkraftteknik

Olof Hjortstam

Hitachi

IEEE Transactions on Dielectrics and Electrical Insulation

1070-9878 (ISSN) 15584135 (eISSN)

Vol. In Press

Styrkeområden

Nanovetenskap och nanoteknik

Transport

Energi

Materialvetenskap

Ämneskategorier (SSIF 2025)

Materialteknik

Kemiteknik

Fysik

Elektroteknik och elektronik

DOI

10.1109/TDEI.2026.3659433

Mer information

Senast uppdaterat

2026-06-11