Characterization of semiconducting glaze by dielectric spectroscopy in frequency domain

Paper i proceeding, 2004

nonlinear voltage dependence

SnO/sub 2/

electrical contacts

semiconducting glaze

glass

polarization relaxation

electrical contacts

chemical analysis

resistivity

dc conductance

frequency domain

IV-VI semiconductors

dielectric spectroscopy

electrical resistivity

chemical analysis

tin oxide particles

dielectric polarisation

4 micron

dielectric relaxation

structural analysis

scanning electron microscopy

glass

low-conductive barrier

dielectric response

10/sup 8/ to 10/sup 9/ ohmm

glassy layer

scanning electron microscopy

circuit model