Charge noise in single-electron transistors and charge qubits may be caused by metallic grains
Artikel i vetenskaplig tidskrift, 2008

We report on measurements of low-frequency noise in a single-electron transistor (SET) from a few hertz up to 10 MHz. Measurements were done for different bias and gate voltages, which allow us to separate noise contributions from different noise sources. We find a 1/f noise spectrum with two Lorentzians superimposed. The cut-off frequency of one of the Lorentzians varies systematically with the potential of the SET island. Our data is consistent with two single-charge fluctuators situated close to the tunnel barrier. We suggest that these are due to random charging of aluminum grains, each acting as a single-electron box with tunnel coupling to one of the leads and capacitively coupled to the SET island. We are able to fit the data to our model and extract parameters for the fluctuators.

Författare

Serguei Kafanov

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Henrik Brenning

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Tim Duty

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Per Delsing

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Physical Review B - Condensed Matter and Materials Physics

1098-0121 (ISSN)

Vol. 78 12 125411- 125411

Ämneskategorier

Fysik

Den kondenserade materiens fysik

DOI

10.1103/PhysRevB.78.125411

Mer information

Skapat

2017-10-08