Characterization of Microwave Transistors for Robust Receivers and High Efficiency Transmitters
Licentiatavhandling, 2009
noise modeling
access resistance
self-heating
AlGaN/GaN HEMT
thermal characterization
active load-pull
load modulation
Författare
Mattias Thorsell
Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik
Characterization Setup for Device Level Dynamic Load Modulation Measurements
International Microwave Symposium Digest, 2009, Boston,;(2009)
Paper i proceeding
An AlGaN/GaN HEMT-Based Microstrip MMIC Process for Advanced Transceiver Design
IEEE Transactions on Microwave Theory and Techniques,;Vol. 56(2008)p. 1827-1833
Artikel i vetenskaplig tidskrift
Characterization of the temperature dependent access resistances in AlGaN/GaN HEMTs
Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, 2008. INMMIC 2008.,;(2008)p. 17-20
Paper i proceeding
Thermal Study of the High-Frequency Noise in GaN HEMTs
IEEE Transactions on Microwave Theory and Techniques,;Vol. 57(2009)p. 19-26
Artikel i vetenskaplig tidskrift
Ämneskategorier
Annan elektroteknik och elektronik
Technical report MC2 - Department of Microtechnology and Nanoscience, Chalmers University of Technology: 1652-0769
Kollektorn, Kemivägen 9, Chalmers
Opponent: Dr. Matthias Rudolph, Ferdinand-Braun-Institut für Höchstfrequenztechnik, Berlin, Germany