Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
Paper i proceeding, 2023

Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.

Författare

M. Buffolo

Università di Padova

M. Zenari

Università di Padova

M. Fornasier

Università di Padova

C. De Santi

Università di Padova

J. Goyvaerts

Universiteit Gent

Alexander Grabowski

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

Johan Gustavsson

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

Sulakshna Kumari

Universiteit Gent

Andim Stassen

Interuniversity Micro-Electronics Center at Leuven

Geert Morthier

Universiteit Gent

Roel G. Baets

Universiteit Gent

Anders Larsson

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

Gunther Roelkens

Universiteit Gent

G. Meneghesso

Università di Padova

E. Zanoni

Università di Padova

M. Meneghini

Università di Padova

2023 Conference on Lasers and Electro-Optics, CLEO 2023

SF2Q.8
9781957171258 (ISBN)

2023 Conference on Lasers and Electro-Optics, CLEO 2023
San Jose, USA,

Ämneskategorier

Annan elektroteknik och elektronik

DOI

10.1364/CLEO_AT.2023.SF2Q.8

Mer information

Senast uppdaterat

2024-05-13