THz metrology for modern wireless systems
New metrology at Terahertz (THz) frequencies is urgently required to address the lack of traceability for S-parameters measurements. Therefore, this project aims to develop methods for precise and traceable characterization of materials, components and systems in the THz frequency range with known measurements uncertainties.
The specific scientific and technical objectives of this research are:
o Detailed uncertainty analysis and explore how fabrication tolerances, variations in ambient conditions, calibration methods etc. affect the measurement accuracy of S-parameters up to 1.5 THz;
o Optimize calibration methods for the highest S-parameter measurement accuracy;
o Develop methods to model devices at THz frequencies;
o Explore high-frequency phenomena in electrical devices;
On a higher level, the project will support the high-frequency electronics industry with a new high-quality toolbox for reliable testing and characterization of their prototypes during development.
Precise and traceable measurements are essential for a growing industry to ensure that parts manufacturers supply correct data and can be compared on equal and fair terms.
Jan Stake (contact)
Full Professor at Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Doctoral Student at Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
RISE Research Institutes of Sweden
Swedish Foundation for Strategic Research (SSF)
Project ID: FID17-0040
(Funding period missing)
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