Advanced VNA-based microwave on-wafer measurements for electronics and 6G communications

Research Project, 2026 – 2029

Semiconductor devices (planar integrated circuits) are critical to the European digital transformation and represent strategic assets in key high-value industrial chains. Therefore, SI traceability needs to be established for a range of key microwave measurement quantities to support the development of advanced planar circuits, particularly semiconductor devices, operating at millimetre-wave and sub-terahertz frequencies. Traceability in this area is needed by emerging applications such as 6G communications. This project will focus on S-parameters (measuring the loss and phase change for transmitted and reflected electrical signals), electromagnetic fields, noise figures, and material characterisation (complex permittivity), all using on-wafer measurements. This will enable European NMIs and DIs to provide SI traceability for these vital measurement quantities, benefiting the communications, electronics, and semiconductor industries.