Johan Bremer

Doctoral Student at Microwave Electronics

Source: chalmers.se

Contact Details

Publications (9)
Projects (0)

Showing 9 publications

2024

Dynamic Thermal Coupling in GaN MMIC Power Amplifiers

Tobias Kristensen, Torbjörn M.J. Nilsson, Andreas Divinyi et al

IEEE Transactions on Microwave Theory and Techniques. Vol. In Press

Journal article

2024

Method for Suppressing Trap-Related Memory Effects in IV Characterizations of GaN HEMTs

Johan Bremer, Niklas Rorsman, Mattias Thorsell

IEEE International Conference on Microelectronic Test Structures

Paper in proceeding

2023

Thermal Transient Measurements of GaN HEMT Structures by Electrical Measurements

Tobias Kristensen, Andreas Divinyi, Johan Bremer et al

2023 18th European Microwave Integrated Circuits Conference, EuMIC 2023, p. 293-296

Paper in proceeding

2020

Characterization and Compensation of Thermal Effects in GaN HEMT Technologies

Johan Bremer

Licentiate thesis

2020

Electric-Based Thermal Characterization of GaN Technologies Affected by Trapping Effects

Johan Bremer, Chen Ding Yuan, Aleksandra Malko et al

IEEE Transactions on Electron Devices. Vol. 67 (5), p. 1952-1958

Journal article

2018

Optimizing the Signal-To-Noise and Distortion Ratio of a GaN LNA using Dynamic Bias

Lowisa Hanning, Johan Bremer, Marie Strom et al

2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018. Vol. 1

Paper in proceeding

2018

Analysis of Lateral Thermal Coupling for GaN MMIC Technologies

Johan Bremer, Johan Bergsten, Lowisa Hanning et al

IEEE Transactions on Microwave Theory and Techniques. Vol. 66 (10), p. 4430-4438

Journal article

2018

Compensation of Performance Degradation Due to Thermal Effects in GaN LNA Using Dynamic Bias

Johan Bremer, Lowisa Hanning, Niklas Rorsman et al

2018 48th European Microwave Conference, EuMC 2018, p. 1213-1216

Paper in proceeding

2018

Analysis of Thermal Effects in Integrated Radio Transmitters

Christian Fager, Mattias Thorsell, Emanuel Baptista et al

2018 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)

Paper in proceeding

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