Johan Bremer

Doctoral Student at Microwave Electronics

Source: chalmers.se
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Showing 10 publications

2024

Dynamic Thermal Coupling in GaN MMIC Power Amplifiers

Tobias Kristensen, Torbjörn M.J. Nilsson, Andreas Divinyi et al
IEEE Transactions on Microwave Theory and Techniques. Vol. In Press
Journal article
2024

Numerical Modeling of Dynamic Thermal Coupling in GaN HEMTs Calibrated by Transient Measurements

Tobias Kristensen, Torbjörn M.J. Nilsson, Andreas Divinyi et al
IEEE Transactions on Electron Devices. Vol. 71 (12), p. 7343-7349
Journal article
2024

Method for Suppressing Trap-Related Memory Effects in IV Characterizations of GaN HEMTs

Johan Bremer, Niklas Rorsman, Mattias Thorsell
IEEE International Conference on Microelectronic Test Structures
Paper in proceeding
2023

Thermal Transient Measurements of GaN HEMT Structures by Electrical Measurements

Tobias Kristensen, Andreas Divinyi, Johan Bremer et al
2023 18th European Microwave Integrated Circuits Conference, EuMIC 2023, p. 293-296
Paper in proceeding
2020

Electric-Based Thermal Characterization of GaN Technologies Affected by Trapping Effects

Johan Bremer, Chen Ding Yuan, Aleksandra Malko et al
IEEE Transactions on Electron Devices. Vol. 67 (5), p. 1952-1958
Journal article
2018

Optimizing the Signal-To-Noise and Distortion Ratio of a GaN LNA using Dynamic Bias

Lowisa Hanning, Johan Bremer, Marie Strom et al
2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018. Vol. 1
Paper in proceeding
2018

Analysis of Lateral Thermal Coupling for GaN MMIC Technologies

Johan Bremer, Johan Bergsten, Lowisa Hanning et al
IEEE Transactions on Microwave Theory and Techniques. Vol. 66 (10), p. 4430-4438
Journal article
2018

Compensation of Performance Degradation Due to Thermal Effects in GaN LNA Using Dynamic Bias

Johan Bremer, Lowisa Hanning, Niklas Rorsman et al
2018 48th European Microwave Conference, EuMC 2018, p. 1213-1216
Paper in proceeding
2018

Analysis of Thermal Effects in Integrated Radio Transmitters

Christian Fager, Mattias Thorsell, Emanuel Baptista et al
2018 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)
Paper in proceeding

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