Interface trap properties of thermally oxidized n-type 4H-SiC and 6H-SiC
Journal article, 2005

Author

Tamara Rudenko

I. Osiyuk

I. Tyagulski

Halldor Olafsson

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Other publications Research

Einar Sveinbjörnsson

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Other publications Research

Solid State Electronics

Vol. 49 545-553

Subject Categories

Condensed Matter Physics

More information

Created

10/6/2017

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