Anisotropic transport properties in InAs/AlSb heterostructures
Journal article, 2010
Hall effect
surface morphology
electric resistance
III-V semiconductors
dislocations
semiconductor growth
electron mobility
indium compounds
high electron mobility transistors
aluminium compounds
cooling
two-dimensional electron gas
semiconductor heterojunctions
Author
Giuseppe Moschetti
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Huan Zhao Ternehäll
Chalmers, Applied Physics, Physical Electronics
Per-Åke Nilsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Shu Min Wang
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Alexei Kalaboukhov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
G. Dambrine
Chalmers, Microtechnology and Nanoscience (MC2)
Lille 1 University of Science and Technology
S. Bollaert
Chalmers, Microtechnology and Nanoscience (MC2)
Lille 1 University of Science and Technology
L. Desplanque
Lille 1 University of Science and Technology
Chalmers, Microtechnology and Nanoscience (MC2)
X. Wallart
Lille 1 University of Science and Technology
Chalmers, Microtechnology and Nanoscience (MC2)
Jan Grahn
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Applied Physics Letters
0003-6951 (ISSN) 1077-3118 (eISSN)
Vol. 97 24 3- 243510Areas of Advance
Nanoscience and Nanotechnology
Materials Science
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1063/1.3527971