Corrosion Properties of Thermally Annealed and Co-sputtered Nickel Silicide Thin Films
Journal article, 2011
X-ray photoelectron spectroscopy (XPS)
Nickel silicides
Grazing incidence X-ray diffraction (GIXRD)
Scanning electron microscopy (SEM)
Sputter deposition
Polarisation
Author
Eric Tam
Chalmers, Materials and Manufacturing Technology, Surface and Microstructure Engineering
Yu Cao
Chalmers, Materials and Manufacturing Technology, Surface and Microstructure Engineering
Urban Paul Einar Jelvestam
Chalmers, Materials and Manufacturing Technology, Surface and Microstructure Engineering
Lars Nyborg
Chalmers, Materials and Manufacturing Technology
Surface and Coatings Technology
0257-8972 (ISSN)
Vol. 206 6 1160-1167Subject Categories
Materials Engineering
Manufacturing, Surface and Joining Technology
Chemical Engineering
Areas of Advance
Materials Science
DOI
10.1016/j.surfcoat.2011.08.004