Reliability of Microtechnology – Interconnects, Devices and Systems
Book, 2011
Author
Johan Liu
Chalmers, Applied Physics, Electronics Material and Systems
Olli Salmela
Jussi Särkkä
James E. Morris
Per-Erik Tegehall
Cristina Andersson
Areas of Advance
Nanoscience and Nanotechnology
Materials Science
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
978-1-4419-5759-7