Towards quantitative three-dimensional characterisation of buried InAs quantum dots
Paper in proceeding, 2011
Communication application
New specimen
Scanning transmission electron microscopy
Atom probe tomography
InAs quantum dots
Wavelength ranges
InP
InGaAsP
Recorded signals
Chemical profiles
Author
S. Kadkhodazadeh
Technical University of Denmark (DTU)
E. S. Semenova
Technical University of Denmark (DTU)
M. Schubert
Technical University of Denmark (DTU)
Mattias Thuvander
Chalmers, Applied Physics, Microscopy and Microanalysis
Krystyna Marta Stiller
Chalmers, Applied Physics, Microscopy and Microanalysis
K. Yvind
Technical University of Denmark (DTU)
R. E. Dunin-Borkowski
Technical University of Denmark (DTU)
Journal of Physics: Conference Series
17426588 (ISSN) 17426596 (eISSN)
Vol. 326 1 012046Subject Categories
Physical Sciences
DOI
10.1088/1742-6596/326/1/012046