A DC Comparison Study Between H-Intercalated and Native epigraphenes on SiC substrates
Paper in proceeding, 2013
DC analysis
uniformity
graphene fabrication
Epi-graphene of SiC
comparison study
memory effects
H-Intercalation
Author
Michael Winters
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Mattias Thorsell
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
J. ul Hassan
Niklas Rorsman
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
E. Janzen
Herbert Zirath
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Materials Science Forum
0255-5476 (ISSN) 16629752 (eISSN)
Vol. 740-742 129-132Subject Categories
Materials Engineering
DOI
10.4028/www.scientific.net/MSF.740-742.129