Electrical Characterization of a New Enamel Insulation
Journal article, 2014
conductivity measurement
Enamel insulation
permittivity measurement
dielectric polarization
surface potential decay
dielectric losses.
Author
Tuan Anh Hoang
Chalmers, Materials and Manufacturing Technology, High Voltage Engineering
Yuriy Serdyuk
Chalmers, Materials and Manufacturing Technology, High Voltage Engineering
Stanislaw Gubanski
Chalmers, Materials and Manufacturing Technology, High Voltage Engineering
IEEE Transactions on Dielectrics and Electrical Insulation
1070-9878 (ISSN) 15584135 (eISSN)
Vol. 21 3 1291-1301 6832277Areas of Advance
Energy
Subject Categories
Other Materials Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/TDEI.2014.6832277