Single-Flange 2-Port TRL Calibration for Accurate THz S-Parameter Measurements of Waveguide Integrated Circuits
Journal article, 2014

This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220–325 GHz).

Membrane

waveguide integrated

S-parameter

TRL

Author

Johanna Hanning

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

GigaHertz Centre

Jörgen Stenarson

SP Sveriges Tekniska Forskningsinstitut AB

Klas Yhland

SP Sveriges Tekniska Forskningsinstitut AB

Peter Sobis

Omnisys Instruments

Tomas Bryllert

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Jan Stake

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

GigaHertz Centre

IEEE Transactions on Terahertz Science and Technology

2156-342X (ISSN)

Vol. 4 5 582-587 6877746

Areas of Advance

Information and Communication Technology

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

Infrastructure

Nanofabrication Laboratory

DOI

10.1109/TTHZ.2014.2342497

More information

Latest update

9/6/2018 1