A comparison between SiO2/4H-SiC interface traps on (0001) and  (11-20) faces

Halldor Olafsson; Christer Hallin; Einar Sveinbjörnsson

A comparison between SiO2/4H-SiC interface traps on (0001) and (11-20) faces
Journal article, 2004

Author

Halldor Olafsson

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Other publications Research

Christer Hallin

Einar Sveinbjörnsson

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Other publications Research

Materials Science Forum

Vol. 457-460 1305-1308

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

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Created

10/6/2017

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A comparison between SiO2/4H-SiC interface traps on (0001) and (11-20) faces Journal article, 2004