A comparison between SiO2/4H-SiC interface traps on (0001) and (11-20) faces
Journal article, 2004
Author
Halldor Olafsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Christer Hallin
Einar Sveinbjörnsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Published in
Materials Science Forum
Vol. 457-460 p. 1305-1308
Categorizing
Subject Categories (SSIF 2011)
Electrical Engineering, Electronic Engineering, Information Engineering