Analysis of the electrono traps at the 4H-SiC/SiO2 interface using combined CV/thermally stimulated current measurements
Journal article, 2004
Author
Tamara Rudenko
Halldor Olafsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Einar Sveinbjörnsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
I. Osiyuk
I Tyagulski
Microelectronics Engineering
Vol. 72 213-
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering