Thermal properties of TIM using CNTs forest in electronics packaging
Paper in proceeding, 2016
resistance temperature detector
hotspot
VACNT
dissipation
thermal test chip
heat
Author
Dongsheng Zhang
Shanghai University
Jiawen Liu
Shanghai University
Johan Liu
Shanghai University
Shuangxi Sun
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Shirong Huang
Shanghai University
Jie Bao
Shanghai University
N. Wang
Shanghai University
Xiuzhen Lu
Shanghai University
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016; Wuhan Optics Valley Kingdom Hotel Wuhan; China; 16 August 2016 through 19 August 2016
1355-1359
Subject Categories
Ceramics
Materials Chemistry
Other Materials Engineering
DOI
10.1109/ICEPT.2016.7583375