Thermal properties of TIM using CNTs forest in electronics packaging
Paper i proceeding, 2016
resistance temperature detector
hotspot
VACNT
dissipation
thermal test chip
heat
Författare
Dongsheng Zhang
Shanghai University
Jiawen Liu
Shanghai University
Johan Liu
Shanghai University
Shuangxi Sun
Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial
Shirong Huang
Shanghai University
Jie Bao
Shanghai University
N. Wang
Shanghai University
Xiuzhen Lu
Shanghai University
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016; Wuhan Optics Valley Kingdom Hotel Wuhan; China; 16 August 2016 through 19 August 2016
1355-1359
Ämneskategorier
Keramteknik
Materialkemi
Annan materialteknik
DOI
10.1109/ICEPT.2016.7583375