Damage evolution around white etching layer during uniaxial loading
Journal article, 2020
strain localization
residual stresses
digital image correlation
white etching layer
X-ray tomography
rolling contact fatigue
Author
Casey Jessop
Chalmers, Industrial and Materials Science, Engineering Materials
Johan Ahlström
Chalmers, Industrial and Materials Science, Engineering Materials
Christer Persson
Chalmers, Industrial and Materials Science, Engineering Materials
Yubin Zhang
Technical University of Denmark (DTU)
Fatigue and Fracture of Engineering Materials and Structures
8756-758X (ISSN) 1460-2695 (eISSN)
Vol. 43 1 201-208Subject Categories
Applied Mechanics
Manufacturing, Surface and Joining Technology
Other Materials Engineering
DOI
10.1111/ffe.13044