Metasurface Optical Characterization Using Quadriwave Lateral Shearing Interferometry
Journal article, 2021

An optical metasurface consists of a dense and usually nonuniform layer of scattering nanostructures behaving as a continuous and extremely thin optical component with predefined phase, transmission and reflection profiles. To date, various sorts of metasurfaces (metallic, dielectric, Huygens-like, Pancharatman-Berry, etc.) have been introduced to design ultrathin lenses, beam deflectors, holograms, or polarizing interfaces. Their actual efficiencies depend on the ability to predict their optical properties and to fabricate nonuniform assemblies of billions of nanoscale structures on macroscopic surfaces. To further help improve the design of metasurfaces, precise and versatile postcharacterization techniques need to be developed. Today, most of the techniques used to characterize metasurfaces rely on light intensity measurements. Here, we demonstrate how quadriwave lateral shearing interferometry (QLSI), a quantitative phase microscopy technique, can achieve full optical characterization of metasurfaces of any kind, as it can probe the local phase imparted by a metasurface with high sensitivity and a spatial resolution that reaches the diffraction limit. As a means to illustrate the versatility of this technique, we present measurements on two types of metasurfaces, namely, Pancharatnam-Berry and effective-refractive-index metasurfaces, and present results on uniform metasurfaces, metalenses, and deflectors.

metasurface

quadriwave lateral shearing interferometry

quantitative phase imaging

metalens

Author

Samira Khadir

University of Côte d'Azur

Institut Fresnel

Daniel Andrén

Chalmers, Physics, Nano and Biophysics

Ruggero Verre

Chalmers, Microtechnology and Nanoscience (MC2), Nanofabrication Laboratory

Qinghua Song

University of Côte d'Azur

Serge Monneret

Institut Fresnel

Patrice Genevet

University of Côte d'Azur

Mikael Käll

Chalmers, Physics, Nano and Biophysics

Guillaume Baffou

Institut Fresnel

ACS Photonics

2330-4022 (eISSN)

Vol. 8 2 603-613

Subject Categories

Atom and Molecular Physics and Optics

Other Physics Topics

Condensed Matter Physics

DOI

10.1021/acsphotonics.0c01707

More information

Latest update

3/24/2021