Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
Paper in proceeding, 2023
Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.
Author
M. Buffolo
University of Padua
M. Zenari
University of Padua
M. Fornasier
University of Padua
C. De Santi
University of Padua
J. Goyvaerts
Ghent university
Alexander Grabowski
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Johan Gustavsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Sulakshna Kumari
Ghent university
Andim Stassen
Interuniversity Micro-Electronics Center at Leuven
Geert Morthier
Ghent university
Roel G. Baets
Ghent university
Anders Larsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Gunther Roelkens
Ghent university
G. Meneghesso
University of Padua
E. Zanoni
University of Padua
M. Meneghini
University of Padua
2023 Conference on Lasers and Electro-Optics, CLEO 2023
SF2Q.8
9781957171258 (ISBN)
2023 Conference on Lasers and Electro-Optics, CLEO 2023
San Jose, USA,
San Jose, USA,
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1364/CLEO_AT.2023.SF2Q.8