Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
Paper in proceeding, 2023

Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.

Author

M. Buffolo

University of Padua

M. Zenari

University of Padua

M. Fornasier

University of Padua

C. De Santi

University of Padua

J. Goyvaerts

Ghent university

Alexander Grabowski

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Johan Gustavsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Sulakshna Kumari

Ghent university

Andim Stassen

Interuniversity Micro-Electronics Center at Leuven

Geert Morthier

Ghent university

Roel G. Baets

Ghent university

Anders Larsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Gunther Roelkens

Ghent university

G. Meneghesso

University of Padua

E. Zanoni

University of Padua

M. Meneghini

University of Padua

2023 Conference on Lasers and Electro-Optics, CLEO 2023

SF2Q.8
9781957171258 (ISBN)

2023 Conference on Lasers and Electro-Optics, CLEO 2023
San Jose, USA,

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1364/CLEO_AT.2023.SF2Q.8

More information

Latest update

5/13/2024