Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
Paper i proceeding, 2023
Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.
Författare
M. Buffolo
Università di Padova
M. Zenari
Università di Padova
M. Fornasier
Università di Padova
C. De Santi
Università di Padova
J. Goyvaerts
Universiteit Gent
Alexander Grabowski
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Johan Gustavsson
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Sulakshna Kumari
Universiteit Gent
Andim Stassen
Interuniversity Micro-Electronics Center at Leuven
Geert Morthier
Universiteit Gent
Roel G. Baets
Universiteit Gent
Anders Larsson
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Gunther Roelkens
Universiteit Gent
G. Meneghesso
Università di Padova
E. Zanoni
Università di Padova
M. Meneghini
Università di Padova
2023 Conference on Lasers and Electro-Optics, CLEO 2023
SF2Q.8
9781957171258 (ISBN)
2023 Conference on Lasers and Electro-Optics, CLEO 2023
San Jose, USA,
San Jose, USA,
Ämneskategorier
Annan elektroteknik och elektronik
DOI
10.1364/CLEO_AT.2023.SF2Q.8