Transient Noise and Gain Characterization for Pulse-Operated LNAs
Journal article, 2024
We propose a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. The method used a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50-ns resolution. The method showed good agreement with static measurements. The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.
Noise
transients
Low-noise amplifier (LNA)
noise figure
Transient analysis
Temperature measurement
Bandwidth
Gain
noise measurement
Oscilloscopes
Noise measurement
Author
Yin Zeng
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jörgen Stenarson
Low Noise Factory AB
Peter Sobis
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jan Grahn
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
IEEE Microwave and Wireless Technology Letters
2771957X (ISSN) 27719588 (eISSN)
Vol. 34 7 911-914Subject Categories
Signal Processing
DOI
10.1109/LMWT.2024.3398248