Transient Noise and Gain Characterization for Pulse-Operated LNAs
Journal article, 2024
We propose a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. The method used a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50-ns resolution. The method showed good agreement with static measurements. The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.
Noise
noise measurement
Noise measurement
Bandwidth
transients
Temperature measurement
Low-noise amplifier (LNA)
Transient analysis
noise figure
Oscilloscopes
Gain
Author
Yin Zeng
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jörgen Stenarson
Low Noise Factory AB
Peter Sobis
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jan Grahn
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
IEEE Microwave and Wireless Technology Letters
2771957X (ISSN) 27719588 (eISSN)
Vol. In PressSubject Categories
Signal Processing
DOI
10.1109/LMWT.2024.3398248