Transient Noise and Gain Characterization for Pulse-Operated LNAs
Artikel i vetenskaplig tidskrift, 2024
We propose a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. The method used a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50-ns resolution. The method showed good agreement with static measurements. The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.
Noise
transients
Low-noise amplifier (LNA)
noise figure
Transient analysis
Temperature measurement
Bandwidth
Gain
noise measurement
Oscilloscopes
Noise measurement
Författare
Yin Zeng
Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik
Jörgen Stenarson
Low Noise Factory AB
Peter Sobis
Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik
Jan Grahn
Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik
IEEE Microwave and Wireless Technology Letters
2771957X (ISSN) 27719588 (eISSN)
Vol. 34 7 911-914Ämneskategorier
Signalbehandling
DOI
10.1109/LMWT.2024.3398248