Impact of the oxide aperture width on the degradation of 845 nm VCSELs for silicon photonics
Journal article, 2024
For the first time, we analyzed the degradation as a function of the oxide aperture in 845 nm VCSELs designed for silicon photonics (SiPh) applications. First, we evaluated the optical degradation of the devices by collecting EL images during a constant current stress. The experimental results showed an increased spreading of the optical beam of the VCSEL with increasing ageing time. Based on numerical simulations, we demonstrated that the electrical degradation (increase in series resistance) is responsible a larger current spreading which, in turn, increases the FWHM (full width half maximum) of the optical beam. We further evaluated the series resistance variation by aging four lasers with different oxide apertures. The results of this set of experiments showed that the electrical degradation is stronger as the oxide aperture is smaller, and mostly depends on the contribution of the top DBR resistance. Thanks to our analysis we proved that the use of a larger aperture can result in a better device reliability.
Optical imaging
Degradation
Degradation
Oxide aperture
Apertures
Stress
Optical beams
Diffusion
Vertical cavity surface emitting lasers
Resistance
PICs
VCSEL
Author
M. Zenari
University of Padua
M. Buffolo
University of Padua
Fabiana Rampazzo
University of Padua
C. De Santi
University of Padua
Francesca Rossi
Institute of Materials for Electronics and Magnetism
Laura Lazzarini
Institute of Materials for Electronics and Magnetism
J. Goyvaerts
LIGENTEC SA
Alexander Grabowski
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Johan Gustavsson
LIGENTEC SA
Roel G. Baets
Ghent university
A. Larsson
Gunther Roelkens
Ghent university
G. Meneghesso
University of Padua
E. Zanoni
University of Padua
M. Meneghini
University of Padua
IEEE Journal of Selected Topics in Quantum Electronics
1077-260X (ISSN) 15584542 (eISSN)
Vol. In PressSubject Categories
Telecommunications
DOI
10.1109/JSTQE.2024.3415674