An Interlaboratory Comparison of On-Wafer S-Parameter Measurements up to 1.1 THz
Journal article, 2025
Author
Faisal Mubarak
Gia Ngoc Phung
Uwe Arz
Kamel Haddadi
Isabelle Roch-Jeune
Guillaume Ducournau
Thomas Flisgen
Ralf Doerner
Djamel Allal
Divya Jayasankar
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Jan Stake
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Robin Schmidt
Gavin Fisher
Nick Ridler
Xiaobang Shang
IEEE Transactions on Terahertz Science and Technology
2156-342X (ISSN) 21563446 (eISSN)
THz metrology for modern wireless systems
Swedish Foundation for Strategic Research (SSF) (FID17-0040), -- .
Areas of Advance
Information and Communication Technology
Infrastructure
Kollberg Laboratory
Subject Categories (SSIF 2025)
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/TTHZ.2025.3537461