Deep-Learning-Based Pixelated Microwave Filter Design and Characterization using Electro-Optical Electric-Field Measurements
Paper in proceeding, 2026

Traditional microwave filter design typically relies on iterative parameter tuning and predefined topologies, which limits design space and increases development time. This study uses a deep learning approach combining convolutional neural networks with genetic algorithms to automate pixelated microwave filter synthesis. To validate the approach experimentally, both S-parameter and spatial electric-field measurements were analyzed. The synthesized low-pass filter demonstrated excellent agreement between simulated and measured performance, achieving a 7 GHz passband with over 20 dB suppression beyond 9.5 GHz. Electro-optical measurements, for the first time, revealed electric field patterns that resemble coupled transmission-lines or stub structures, providing insight into the emergent characteristics of AI-generated designs.

filters

convolutional neural network (CNN)

electro-optical (EO)

deep learning

Artificial intelligence (AI)

microwave measurements.

Author

Han Zhou

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Richard Bannister

University of Surrey

Caspar Pierce

University of Surrey

Haojie Chang

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

David Widén

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Ludvig Fornstedt

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Gabriel Melin

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Alexander Bohlin

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Pontus Lindeberg Fredriksson

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Dilbagh Singh

National Physical Laboratory (NPL)

Christian Fager

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Koen Buisman

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

IEEE MTT-S International Microwave Symposium Digest

0149645X (ISSN)

2026 IEEE International Microwave Symposium
Boston, USA,

Subject Categories (SSIF 2025)

Other Electrical Engineering, Electronic Engineering, Information Engineering

Condensed Matter Physics

More information

Latest update

6/22/2026