Deep-Learning-Based Pixelated Microwave Filter Design and Characterization using Electro-Optical Electric-Field Measurements
Paper in proceeding, 2026
filters
convolutional neural network (CNN)
electro-optical (EO)
deep learning
Artificial intelligence (AI)
microwave measurements.
Author
Han Zhou
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Richard Bannister
University of Surrey
Caspar Pierce
University of Surrey
Haojie Chang
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
David Widén
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Ludvig Fornstedt
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Gabriel Melin
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Alexander Bohlin
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Pontus Lindeberg Fredriksson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Dilbagh Singh
National Physical Laboratory (NPL)
Christian Fager
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Koen Buisman
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
IEEE MTT-S International Microwave Symposium Digest
0149645X (ISSN)
Boston, USA,
Subject Categories (SSIF 2025)
Other Electrical Engineering, Electronic Engineering, Information Engineering
Condensed Matter Physics