Deep-Learning-Based Pixelated Microwave Filter Design and Characterization using Electro-Optical Electric-Field Measurements
Paper i proceeding, 2026

Traditional microwave filter design typically relies on iterative parameter tuning and predefined topologies, which limits design space and increases development time. This study uses a deep learning approach combining convolutional neural networks with genetic algorithms to automate pixelated microwave filter synthesis. To validate the approach experimentally, both S-parameter and spatial electric-field measurements were analyzed. The synthesized low-pass filter demonstrated excellent agreement between simulated and measured performance, achieving a 7 GHz passband with over 20 dB suppression beyond 9.5 GHz. Electro-optical measurements, for the first time, revealed electric field patterns that resemble coupled transmission-lines or stub structures, providing insight into the emergent characteristics of AI-generated designs.

filters

convolutional neural network (CNN)

electro-optical (EO)

deep learning

Artificial intelligence (AI)

microwave measurements.

Författare

Han Zhou

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Richard Bannister

University of Surrey

Caspar Pierce

University of Surrey

Haojie Chang

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

David Widén

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Ludvig Fornstedt

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Gabriel Melin

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Alexander Bohlin

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Pontus Lindeberg Fredriksson

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Dilbagh Singh

National Physical Laboratory (NPL)

Christian Fager

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

Koen Buisman

Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik

IEEE MTT-S International Microwave Symposium Digest

0149645X (ISSN)

2026 IEEE International Microwave Symposium
Boston, USA,

Ämneskategorier (SSIF 2025)

Annan elektroteknik och elektronik

Den kondenserade materiens fysik

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Senast uppdaterat

2026-06-22