Transmission electron microscopy and X-ray diffraction analysis of alumina coating by alternate-current inverted magnetron-sputtering technique
Journal article, 2007
Author
Aditya Aryasomayajula
Sead Canovic
Chalmers, Applied Physics, Microscopy and Microanalysis
Deepak Bhat
Matt Gordon
Mats Halvarsson
Chalmers, Applied Physics, Microscopy and Microanalysis
Thin Solid Films
Vol. 516 397-401
Subject Categories
Other Engineering and Technologies not elsewhere specified