Transmission electron microscopy and X-ray diffraction analysis of alumina coating by alternate-current inverted magnetron-sputtering technique
Journal article, 2007

Author

Aditya Aryasomayajula

Sead Canovic

Chalmers, Applied Physics, Microscopy and Microanalysis

Deepak Bhat

Matt Gordon

Mats Halvarsson

Chalmers, Applied Physics, Microscopy and Microanalysis

Thin Solid Films

Vol. 516 397-401

Subject Categories

Other Engineering and Technologies not elsewhere specified

More information

Created

10/6/2017