Benchmarking of low band gap III-V based HEMTs and sub-100nm CMOS under low drain voltage regime
Paper in proceedings, 2007

Author

Sylvain Bollaert

Ludovic Desplanque

Xavier Wallart

Yannick Roelens

Mikael Malmkvist

Chalmers, Microtechnology and Nanoscience (MC2)

Malin Borg

Chalmers, Microtechnology and Nanoscience (MC2)

Eric Lefebvre

Chalmers, Microtechnology and Nanoscience (MC2)

Jan Grahn

Chalmers, Microtechnology and Nanoscience (MC2)

Derek Smith

Gilles Dambrine

Proc. European Microwave Integrated Circuit Conference (EuMIC)

pp. 20-23

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017