Benchmarking of low band gap III-V based HEMTs and sub-100nm CMOS under low drain voltage regime
Paper in proceeding, 2007
Author
Sylvain Bollaert
Ludovic Desplanque
Xavier Wallart
Yannick Roelens
Mikael Malmkvist
Chalmers, Microtechnology and Nanoscience (MC2)
Malin Borg
Chalmers, Microtechnology and Nanoscience (MC2)
Eric Lefebvre
Chalmers, Microtechnology and Nanoscience (MC2)
Jan Grahn
Chalmers, Microtechnology and Nanoscience (MC2)
Derek Smith
Gilles Dambrine
Proc. European Microwave Integrated Circuit Conference (EuMIC)
pp. 20-23
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering