A General Statistical Equivalent-Circuit-Based De-Embedding Procedure for High-Frequency Measurements
Journal article, 2008
de-embedding
semiconductor device modeling
high-frequency measurement
CMOS
scattering parameters
maximum-likelihood estimation
Author
Mattias Ferndahl
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Christian Fager
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Kristoffer Andersson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Peter Linner
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Hans-Olof Vickes
Saab
Herbert Zirath
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
IEEE Transactions on Microwave Theory and Techniques
0018-9480 (ISSN) 15579670 (eISSN)
Vol. 56 12 2692-2700 4682659Subject Categories
Control Engineering
DOI
10.1109/TMTT.2008.2007188