Thin foil analysis in the SEM
Journal article, 2008

This paper explores the possibilities for imaging and chemical analysis of thin foil specimens in the SEM. Bright field and dark field imaging provide high resolution imaging with crystallographic information within the grains. In multiphase materials with varying electron transmission the dark field images generally provide a more even contrast in all phases. It is possible to obtain high-quality quantitative EDX data with high spatial resolution.

Author

Mats Halvarsson

Chalmers, Applied Physics, Microscopy and Microanalysis

Torbjörn Jonsson

Chalmers, Applied Physics, Microscopy and Microanalysis

Sead Canovic

Chalmers, Applied Physics, Microscopy and Microanalysis

Journal of Physics: Conference Series

17426588 (ISSN) 17426596 (eISSN)

4-

Subject Categories

Other Engineering and Technologies not elsewhere specified

DOI

10.1088/1742-6596/126/1/012075

More information

Created

10/6/2017