Extraction of the intrinsic base region sheet resistance in bipolar transistors
Paper in proceeding, 2000
Author
Fredrik Ingvarson
Department of Microelectronics
Martin Linder
Kjell Jeppson
Department of Microelectronics
Shi-Li Zhang
Jan Grahn
Mikael Östling
Proceedings of the 2000 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
184-186
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering