Symmetrical modeling of GaN HEMTS
Paper i proceeding, 2014
This paper presents a symmetrical small signal model for GaN HEMTs valid for both positive and negative Vds. The model takes advantage of the intrinsic symmetry of the devices typically used for switches. The parameters of the model are extracted using a new symmetrical optimization based extraction method, optimizing simultaneously for both positive and negative drain-source bias points. This ensures a symmetrical small signal model with lower modeling error. The small signal model can be further used to simplify the development of a large-signal model. The small signal model is validated with measured S- parameters of a commercial GaN HEMT.
Semiconductor device modeling
Parameters extraction
Gallium Nitride
Modeling
HEMTs
Författare
Ankur Prasad
Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik
Gigahertzcentrum
Christian Fager
Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik
Gigahertzcentrum
Mattias Thorsell
Chalmers, Mikroteknologi och nanovetenskap, Mikrovågselektronik
Gigahertzcentrum
Christer Andersson
Mitsubishi Electric Corporation
Klas Yhland
Gigahertzcentrum
SP Sveriges Tekniska Forskningsinstitut AB
Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC
1550-8781 (ISSN)
978-147993622-9 (ISBN)
Styrkeområden
Informations- och kommunikationsteknik
Ämneskategorier
Elektroteknik och elektronik
DOI
10.1109/CSICS.2014.6978581
ISBN
978-147993622-9