Improved Molecular Imaging in Rodent Brain with Time-of-Flight-Secondary Ion Mass Spectrometry Using Gas Cluster Ion Beams and Reactive Vapor Exposure
Artikel i vetenskaplig tidskrift, 2015

Imaging mass spectrometry has shown to be a valuable method in medical research and can be performed using different instrumentation and sample preparation methods, each one with specific advantages and drawbacks. Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) has the advantage of high spatial resolution imaging but is often restricted to low mass molecular signals and can be very sensitive to sample preparation artifacts. In this report we demonstrate the advantages of using gas cluster ion beams (GCIBs) in combination with trifluoracetic acid (TFA) vapor exposure for the imaging of lipids in mouse brain sections. There is an optimum exposure to TFA that is beneficial for increasing high mass signal as well as producing signal from previously unobserved species in the mass spectrum. Cholesterol enrichment and crystallization on the sample surface is removed by TFA exposure uncovering a wider range of lipid species in the white matter regions of the tissue, greatly expanding the chemical coverage and the potential application of TOF-SIMS imaging in neurological studies. Ar-4000(+) (40 keV) in combination with TFA treatment facilitates high resolution, high mass imaging closing the gap between TOF-SIMS and matrix-assisted laser desorption ionization (MALDI).

Författare

Tina B. Angerer

Göteborgs universitet

Masoumeh Dowlatshahi Pour

Chalmers, Kemi och kemiteknik, Kemi och biokemi, Analytisk kemi

Per Malmberg

Chalmers, Kemi och kemiteknik, Kemi och biokemi, Analytisk kemi

John Fletcher

Chalmers, Kemi och kemiteknik, Kemi och biokemi, Analytisk kemi

Göteborgs universitet

Analytical Chemistry

0003-2700 (ISSN) 1520-6882 (eISSN)

Vol. 87 4305-4313

Ämneskategorier

Analytisk kemi

Kemiteknik

DOI

10.1021/ac504774y