Influence of the channel width on the threshold voltage modulation in MOSFETs
Artikel i vetenskaplig tidskrift, 1975

The threshold voltage of an MOS field-effect transistor is modulated by the source-to-substrate reverse bias. In the letter, the theory for long- and short-channel transistors is extended to include the influence of the channel width. The result is an analytical expression for the threshold voltage as a function of geometry and bias that agrees well with experimental data.

Field-effect transistors

channel width

threshold voltage modulation

MOSFET

Författare

Kjell Jeppson

Institutionen för mikroelektronik och nanovetenskap

Electronics Letters

0013-5194 (ISSN) 1350-911X (eISSN)

Vol. 11 14 297-299

Styrkeområden

Nanovetenskap och nanoteknik

Ämneskategorier

Elektroteknik och elektronik

DOI

10.1049/el:19750225

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Senast uppdaterat

2023-09-08