DC and microwave performance of AlGaN/GaN HEMTs passivated with sputtered SiNx
Artikel i vetenskaplig tidskrift, 2007

The effects of sputtered and room temperature plasma enhanced chemical vapour deposition (RT-PECVD) SiNx passivation on the dc and microwave performance of AlGaN/GaN high electron mobility transistors (HEMTs)are studied. The pulsed I–V characteristics from a class B quiescent bias point and transient measurements indicate that the sputtered SiNx passivation is more efficient in suppressing lag effects in AlGaN/GaN HEMTs. Dispersion-free sputtered SiNx passivated AlGaN/GaN HEMTs were obtained using this technique. Continuous-wave (CW) measurements without active cooling give a maximum output power density of 6.6 W mm−1 at Vgs=−4 V, Vds = 50 V and a maximum power added efficiency of 51.3% at Vgs=−4 V, Vds = 30 V at 3 GHz on 2 × 50 μm AlGaN/GaN HEMTs on the sapphire substrate, with a gate length of 2 μm and without field-plated gates. To the best of our knowledge, this is the highest level power density reported on the sapphire substrate without field-plate design. The extrinsic cut-off frequency ( ft) and maximum oscillation frequency ( fmax) are 51 GHz and 100 GHz, respectively, on 2 × 50 × 0.15 μm HEMTs. To our knowledge, the sputtered SiNx passivation for AlGaN/GaN HEMTs is a unique technique, which has never been published before.

Författare

Vincent Desmaris

Chalmers, Mikroteknologi och nanovetenskap (MC2), Mikrovågselektronik

Niklas Rorsman

Chalmers, Mikroteknologi och nanovetenskap (MC2), Mikrovågselektronik

Kazuhide Kumakura

Toshiki Makimoto

Herbert Zirath

Chalmers, Mikroteknologi och nanovetenskap (MC2), Mikrovågselektronik

Edward-Yi Chang

Semicronductor Science and Technology

Vol. 22 717-721

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