Reliability study of THz Schottky mixers and HBV frequency multipliers for space applications
Paper i proceeding, 2020

We report status and current results of the preliminary reliability study on 300 GHz InP heterostructure barrier varactor diode multipliers and 1200 GHz GaAs Schottky diode mixers. Both types of diodes are monolithically integrated with circuits and were processed on 3" InP and GaAs wafers respectively using established III-V processing. We will present results on thermal step-stress tests up to 300oC, indicating the operational temperature limitations of the devices. Also, the analysis of the accelerated lifetime testing (1000h) will be discussed.

Författare

Vladimir Drakinskiy

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

Josip Vukusic

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

Daniel Heinerås

Wasa Millimeter Wave AB

Peter Sobis

Omnisys Instruments

Vaclav Valenta

Europeiska rymdorganisationen (ESA)

Marie Genevieve Perichaud

Europeiska rymdorganisationen (ESA)

Fernando Martinez Martin

Europeiska rymdorganisationen (ESA)

Jan Stake

Chalmers, Mikroteknologi och nanovetenskap (MC2), Terahertz- och millimetervågsteknik

Proceedings of the 31st Symposium on Space Terahertz Technology, ISSTT 2020

118-

2020 31st IEEE International Symposium on Space Terahertz Technology, ISSTT 2020
Tempe, USA,

Ämneskategorier

Tillförlitlighets- och kvalitetsteknik

Annan materialteknik

Annan elektroteknik och elektronik

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Senast uppdaterat

2021-07-15