Evaluation of Operating Range of a Machine Emulator for a Back-to-Back Power-Hardware-in-the-Loop Test Bench
Artikel i vetenskaplig tidskrift, 2022

Inverter testing using laboratory test benches with rotating machines can be bulky, complex and maintenance intensive. One solution is to use machine emulator for laboratory testing of inverters. The emulator is controlled in such a way that currents and voltages at the terminals resemble a machine connected to a mechanical load. A machine emulator for a back-to-back power-hardware-in-the-loop (PHIL) test bench is proposed in this study. The PHIL test bench consists of two identical VSCs with three single-phase inductors as coupling network. The two VSCs are connected to the same DC supply. One VSC acts as inverter under test (IUT) while the other is part of machine emulator. Aim of this paper is to analyze the influence of coupling inductance on operating range of the emulator. An analytical method to dimension the coupling inductance is introduced and verified in experiments. The operating range of the emulator is also evaluated. The performance of the IUT when tested with an equivalent PMSM in simulations and that of a prototyped 60-kW rated machine emulator are compared. Sensitivity of emulator control on parameter estimation is discussed. The experimental results show good agreement with simulations in both steady-state and dynamic conditions.

variable speed drives

Voltage measurement

Couplings

real time emulation

Inverters

Rotors

permanent magnet synchronous motor (PMSM)

power-hardware-in-the-loop (PHIL) test benches

Inductance

Emulation

Voltage control

Power conversion

Författare

Nimananda Sharma

Chalmers, Elektroteknik, Elkraftteknik

Georgios Mademlis

Chalmers, Elektroteknik, Elkraftteknik

Yujing Liu

Chalmers, Elektroteknik, Elkraftteknik

Junfei Tang

Chalmers, Elektroteknik, Elkraftteknik

IEEE Transactions on Industrial Electronics

0278-0046 (ISSN) 15579948 (eISSN)

Vol. 69 10 9783-9792

Ämneskategorier

Teknisk mekanik

Farkostteknik

Annan elektroteknik och elektronik

DOI

10.1109/TIE.2022.3142421

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Senast uppdaterat

2024-03-07