DC Electrical Trees in XLPE Induced by Short Circuits
Paper i proceeding, 2021

This study aims at understanding electrical treeing in XLPE due to DC short circuits. A wire-plane type test object has been excited by a series of short circuit events after applying DC voltages of different levels and duration. The development of thin filamentary trees and their morphology was correlated with the inception probability. It was observed that the latter as well as the length of the trees increased with the magnitude of the applied voltage and the number of short circuit events. These observations are in good agreement with the hypothesis that the release of stored energy during short circuit
causes electromechanical stresses in the materials giving rise to treeing process analogous to mechanical crack formation. It is suggested that the application of an adequate number of short circuits at a suitable voltage level and a sufficient stress duration can be used as a DC treeing test procedure.

Författare

Sarath Kumara

Chalmers, Elektroteknik, Elkraftteknik, Elnät och komponenter

Thomas Hammarström

Chalmers, Elektroteknik, Elkraftteknik, Elnät och komponenter

Xiangdong Xu

Chalmers, Elektroteknik, Elkraftteknik, Elnät och komponenter

Amir Masoud Pourrahimi

Chalmers, Kemi och kemiteknik, Tillämpad kemi, Christian Müller Group

Christian Müller

Chalmers, Kemi och kemiteknik, Tillämpad kemi, Christian Müller Group

Yuriy Serdyuk

Chalmers, Elektroteknik, Elkraftteknik, Elnät och komponenter

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

00849162 (ISSN)

Vol. 2021-December 275-278
978-1-6654-1907-9 (ISBN)

IEEE Conference on Electrical Insulation and Dielectric Phenomena
Vancouver, Canada,

Styrkeområden

Energi

Ämneskategorier

Annan elektroteknik och elektronik

DOI

10.1109/CEIDP50766.2021.9705362

Mer information

Senast uppdaterat

2022-04-04